Luna LWA 7601-O O-Band Lightwave Analyzer (LWA 7600 Series OFDR)
O-band OFDR lightwave analyzer that measures distributed return loss, insertion loss and length of optical components and networks.
- Length measurement modes (in reflection)
- 20 m, 50 m, 100 m; Optional: 200 m, 500 m, 1000m
- Maximum measurement length, reflection
- 100 / 200 / 500 / 1000
- Maximum measurement length, transmission
- 200 / 400 / 1000 / 2000
- Sampling resolution (two-point)
- 10 / 20 / 80 / 80
Overview
The Luna LWA 7601-O is an O-band member of the LWA 7600 Series of lightwave analyzers. It is designed for testing passive optical components and networks. It measures and analyzes insertion loss (IL) and return loss (RL) distribution, as well as length, scanning optical components in either reflection or transmission mode.
The instrument uses optical frequency domain reflectometry (OFDR) to measure backscattered or transmitted light as a function of distance/time (or wavelength). Its high sensitivity and fine sampling resolution, below 5 µm in silicon photonics (ng = 3.5), suit it to the analysis of photonic integrated circuits (PICs). With the extended range option, it can measure up to 1000 m, which also covers fiber network testing.
A single instrument measures RL, IL and length in reflection or transmission, which reduces the cost and complexity of test and increases throughput in R&D and manufacturing. The standard instrument has length measurement modes of 20 m, 50 m and 100 m in reflection. The 200 m, 500 m and 1000 m modes are optional.
Software and control
The LWA 7600 application software has a delay plot, a spectral plot of return loss and group delay, and an event table. Results can be saved as .ofdr measurement files or TSV data files. On the LWA 7601-O, the acquired wavelength range can be narrowed for faster measurements, and the laser can be used as a single-wavelength light source. Remote control uses a SCPI API over TCP/IP. A remote user interface is available for Windows and Ubuntu Linux.
Key Features
- Return loss (RL) and insertion loss (IL) analysis
- Analyze components in reflection and transmission
- Trace distributed RL over length of optical path
- Spectral analysis of RL and IL
- Detect and precisely locate reflective events and measure path length (up to 1000 m)
- Speed, resolution and accuracy for optimizing production test
- 4.29 μm sampling resolution in Silicon Photonics (ng =3.5) or 10 μm in fiber (ng =1.5)
- 1 Hz scan/acquisition rate
- Length measurement modes of 20 m, 50 m, 100 m in reflection; optional 200 m, 500 m, 1000 m
- Reflection measurements: total IL, spectral amplitude response, total path length, RL versus length, event loss, RL spectral amplitude analysis, event length
- SCPI API over TCP/IP remote interface
Specifications
| Length measurement modes (in reflection) | 20 m, 50 m, 100 m; Optional: 200 m, 500 m, 1000m |
|---|---|
| Maximum measurement length, reflection |
100 / 200 / 500 / 1000
Per datasheet measurement mode columns; 500 m / 1000 m with extended range option (OPT07650 / OPT07651 per datasheet note 1)
|
| Maximum measurement length, transmission |
200 / 400 / 1000 / 2000
Per datasheet measurement mode columns
|
| Sampling resolution (two-point) |
10 / 20 / 80 / 80
Per measurement mode (100 / 200 / 500 / 1000 m); distance between two sample points along the length axis in SMF-28
|
| Wavelength accuracy |
±1.5
Accuracy guaranteed via internal NIST-traceable HCN gas cell
|
| Wavelength resolution (max) |
0.02
Accuracy guaranteed via internal NIST-traceable HCN gas cell
|
| Time-of-flight delay accuracy |
± 0.001 / ± 0.001 / ± 0.005 / ± 0.005
Per measurement mode (100 / 200 / 500 / 1000 m); accuracy guaranteed via internal NIST-traceable HCN gas cell
|
| Center wavelength | 1305 |
| Wavelength scan range |
± 30 / ± 15 / ± 3.75 / ± 3.75
Per measurement mode (100 / 200 / 500 / 1000 m)
|
| Instrument wavelength | 1260 nm – 1360 nm |
| Measurement time (in continuous mode) |
~1 (50 m), ~2.1 (100 m) / ~2.3 / ~1.3 / ~2.3
Per measurement mode (100 / 200 / 500 / 1000 m). The product page lists 1000 (50m) ms
|
| Maximum optical power | 5 |
| RL dynamic range |
90
Range between strongest reflection greater than -60 dB and noise floor
|
|---|---|
| Total range |
0 to -140
Noise floor return loss at half of maximum length
|
| Sensitivity |
-145
Noise floor return loss at half of maximum length
|
| Resolution |
0.05
Measured with 50 cm integration width, and 85 nm wavelength range / 10 THz optical frequency range
|
| Accuracy |
±1
Measured with 50 cm integration width, and 85 nm wavelength range / 10 THz optical frequency range
|
| IL dynamic range, in transmission mode | 90 |
|---|---|
| IL dynamic range, in reflection mode |
20
Two way loss before backscatter reaches noise floor and IL measurements are no longer possible
|
| Resolution |
0.05
Applies to IL at a spatially localized event, from the difference in fiber Rayleigh scatter RL before and after the event
|
| Accuracy |
± 0.4 (typical ± 0.2)
dB; laser sweep spectral range at least 10 THz and integration width at least 0.5 m, same fiber type before and after the event
|
| Remote interface | SCPI API over TCP/IP |
|---|---|
| Optical connector type | FC/APC |
| Dimensions | 35 (L) x 47 (W) x 10 (H) |
| Weight (controller not included) | 25 (11.4) |
Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.
Applications
- Spatial RL testing
- Automated IL test and analysis
- Skew measurement with sub-picosecond resolution
- PIC waveguide devices, PLCs, AWGs, ROADMs
- Optical fiber networks, cable and subassemblies
- Silicon photonics
Included
- Instrument mainframe for O band with measurement length modes of up to 100 m in reflection mode (200 m in transmission)
- Instrument controller (workstation-class laptop)
- Application software
- Accessory kit
Options & Accessories
| Option | Description |
|---|---|
| OPT07651 | Extended range option — Extends measurement length of the LWA 7601-O to 1000 m (in reflection). |
| LWA 7601-O-RM | Lightwave Analyzer Rack-mountable Mainframe — Instrument mainframe for O bands with measurement length modes of up to 100 m in reflection mode (200 m in transmission), instrument controller (rack-mountable), application software and accessory kit. |