Luna LWA 7601-CL-RM Rack-Mountable C/L Band Lightwave Analyzer
Rack-mountable C/L band OFDR lightwave analyzer measuring distributed return loss, insertion loss and length of optical components and networks.
- Length measurement modes (in reflection)
- 20 m, 50 m, 100 m; Optional: 200 m, 500 m, 1000m
- Maximum measurement length, reflection
- 100 / 200 / 500 / 1000
- Maximum measurement length, transmission
- 200 / 400 / 1000 / 2000
- Sampling resolution (two-point)
- 10 / 20 / 80 / 80
Overview
The Luna LWA 7601-CL-RM is the rack-mountable version of the LWA 7601-CL Lightwave Analyzer, a C/L band member of the LWA 7600 Series. It is designed for testing passive optical components and networks, measuring and analyzing the distribution of insertion loss (IL) and return loss (RL), as well as length, while scanning optical components in either reflection or transmission mode.
Measurement principle
The instrument uses optical frequency domain reflectometry (OFDR) to measure backscattered or transmitted light as a function of distance/time or wavelength. Its sensitivity and sampling resolution make it suitable for photonic integrated circuits (PICs) and silicon photonics, with a sampling resolution of 4.29 μm in silicon photonics (ng = 3.5) or 10 μm in fiber (ng = 1.5). With the extended range option, measurement range reaches up to 1000 m in reflection, which allows testing of fiber networks.
Configuration
The LWA 7601-CL-RM combines the C/L band instrument mainframe with a rack-mountable instrument controller, application software and accessory kit. Measuring RL, IL and length in reflection or transmission with a single instrument reduces test cost and complexity while increasing throughput in R&D and manufacturing test. The instrument can be controlled remotely through a SCPI API over TCP/IP.
Key Features
- Return loss (RL) and insertion loss (IL) analysis
- Analyze components in reflection and transmission
- Trace distributed RL over length of optical path
- Spectral analysis of RL and IL
- Detect and precisely locate reflective events and measure path length (up to 1000 m)
- Speed, resolution and accuracy for optimizing production test
- 4.29 μm sampling resolution in Silicon Photonics (ng =3.5) or 10 μm in fiber (ng =1.5)
- 1 Hz scan/acquisition rate
- Rack-mountable instrument controller
Specifications
| Length measurement modes (in reflection) | 20 m, 50 m, 100 m; Optional: 200 m, 500 m, 1000m |
|---|---|
| Maximum measurement length, reflection |
100 / 200 / 500 / 1000
Per length mode; 500 m / 1000 m with extended range option (OPT07650 / OPT07651)
|
| Maximum measurement length, transmission |
200 / 400 / 1000 / 2000
Per length mode; longer modes with extended range option (OPT07650 / OPT07651)
|
| Sampling resolution (two-point) |
10 / 20 / 80 / 80
Per 100 / 200 / 500 / 1000 m reflection mode; distance between two sample points along the length axis in SMF-28
|
| Wavelength accuracy |
±1.5 pm
Accuracy guaranteed via internal NIST-traceable HCN gas cell
|
| Wavelength resolution (max) | 0.02 pm |
| Time-of-flight delay accuracy |
± 0.001 / ± 0.001 / ± 0.005 / ± 0.005 %
Per 100 / 200 / 500 / 1000 m reflection mode; via internal NIST-traceable HCN gas cell
|
| Center wavelength | 1566.35 nm |
| Wavelength scan range |
± 40 / ± 20 / ± 5 / ± 5 nm
Per 100 / 200 / 500 / 1000 m reflection mode
|
| Instrument wavelength | 1520 nm – 1630 nm |
| Measurement time (in continuous mode) |
~1 (50 m), ~2.1 (100 m); ~2.3 / ~1.3 / ~2.3 s
Later values for 200 / 500 / 1000 m modes
|
| Maximum optical power | 5 mW |
| RL dynamic range |
90 dB
Range between strongest reflection greater than -60 dB and noise floor
|
|---|---|
| Total range |
0 to -140 dB
Noise floor return loss at half of maximum length
|
| Sensitivity |
-145 dB
Noise floor return loss at half of maximum length
|
| Resolution |
0.05 dB
Measured with 50 cm integration width, and 85 nm wavelength range / 10 THz optical frequency range
|
| Accuracy |
±1 dB
Measured with 50 cm integration width, and 85 nm wavelength range / 10 THz optical frequency range
|
| IL dynamic range, in transmission mode | 90 dB |
|---|---|
| IL dynamic range, in reflection mode |
20 dB
Two way loss before backscatter reaches noise floor and IL measurements are no longer possible
|
| Resolution |
0.05 dB
Applies to IL at a spatially localized event, from RL of fiber Rayleigh scatter before and after the event
|
| Accuracy |
± 0.4 (typical ± 0.2) dB
Requires laser sweep spectral range of at least 10 THz and integration width of at least 0.5 m
|
| Remote interface | SCPI API over TCP/IP |
|---|---|
| Optical connector type | FC/APC |
| Dimensions | 35 (L) x 47 (W) x 10 (H) cm |
| Weight (controller not included) | 25 (11.4) lb (kg) |
Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.
Applications
- Spatial RL testing
- Automated IL test and analysis
- Skew measurement with sub-picosecond resolution
- PIC waveguide devices, PLCs, AWGs, ROADMs
- Optical fiber networks, cable and subassemblies
- Silicon photonics
Included
- Instrument mainframe for C/L bands with measurement length modes of up to 100 m in reflection mode (200 m in transmission)
- Instrument controller (rack-mountable)
- Application software
- Accessory kit
Options & Accessories
| Option | Description |
|---|---|
| OPT07650 | Extended range option (500 m) — Extended range option for 500 m measurement length. |
| OPT07651 | Extended range option — Extends measurement length of the LWA 7601-CL to 1000 m (in reflection). |