Luna LWA 7601-C-RM C-Band Lightwave Analyzer, Rack-Mountable Mainframe

Rack-mountable C-band OFDR lightwave analyzer that measures distributed return loss, insertion loss and length with 20 µm sampling resolution.

Length measurement modes (in reflection): 20 m, 50 m, 100 m; Optional: 200 m, 500 m
Maximum measurement length, reflection: 100 m
Maximum measurement length, reflection: 500 m
Maximum measurement length, transmission: 200 m

Datasheet

Overview

The Luna LWA 7601-C-RM is the rack-mountable version of the LWA 7601-C Lightwave Analyzer, a C-band instrument for testing passive optical components and modules. It ships with a rack-mountable instrument controller instead of a laptop, for lab and production environments.

The analyzer uses optical frequency domain reflectometry (OFDR) to measure backscattered or transmitted light as a function of distance/time or wavelength. It measures and analyzes the insertion loss (IL) and return loss (RL) distribution, as well as length, scanning optical components in either reflection or transmission mode.

With 20 µm sampling resolution and high sensitivity, the instrument is suited to photonic integrated circuits (PICs) and silicon photonics. The standard instrument offers length measurement modes of 20 m, 50 m and 100 m in reflection; the OPT07650 extended range option extends the reflection measurement length to 500 m for fiber network testing.

Software and remote control

The LWA 7600 Series application software provides delay and spectral plots, cursors for RL, IL and length measurements, and an event table. The instrument is remotely controlled through a SCPI API over TCP/IP, and remote user interfaces are available for Windows and Linux.

Key Features

Return loss (RL) and insertion loss (IL) analysis
Analyze components in reflection and transmission
Trace distributed RL over length of optical path
Spectral analysis of RL and IL
Detect and precisely locate reflective events and measure path length (up to 500 m)
Speed, resolution and accuracy for optimizing production test
20 μm sampling resolution
12 Hz scan/acquisition rate
19-inch rack-mount version for lab and production environments
Remote control via SCPI API over TCP/IP

Specifications

Measurement

Length measurement modes (in reflection)	20 m, 50 m, 100 m; Optional: 200 m, 500 m
Maximum measurement length, reflection	100 m Web page lists 1000 m; data sheet value used
Maximum measurement length, reflection OPT07650	500 m With extended range option OPT07650
Maximum measurement length, transmission	200 m Web page lists 2000 m; data sheet value used
Maximum measurement length, transmission OPT07650	1000 m With extended range option OPT07650
Sampling resolution (two-point)	20 µm Distance between two sample points along the length axis in SMF-28
Sampling resolution (two-point) OPT07650	80 µm With extended range option OPT07650
Wavelength accuracy	± 6 pm Accuracy guaranteed via internal NIST-traceable HCN gas cell
Time-of-flight delay accuracy	± 0.001 % Accuracy guaranteed via internal NIST-traceable HCN gas cell
Center wavelength	1546.69 nm
Wavelength scan range	± 20 Unit not printed in data sheet
Wavelength scan range OPT07650	± 5 With extended range option OPT07650; unit not printed in data sheet
Wavelength range	1515 nm – 1570 nm Listed for 7601-C in the user guide
Measurement time (in continuous mode)	0.08 s (20 m), 0.4 s (100 m)
Measurement time (in continuous mode) OPT07650	0.5 s With extended range option OPT07650
Maximum optical power	5 mW

Return Loss Characteristics (Reflection Mode)

RL dynamic range	70 dB Range between strongest reflection greater than -60 dB and noise floor
Total range	0 to -130 dB Noise floor return loss at half of maximum length
Sensitivity	-135 dB Noise floor return loss at half of maximum length
Resolution	± 0.1 dB Measured with 1 cm integration width
Accuracy	± 0.5 dB Measured with 1 cm integration width

Insertion Loss Characteristics (Reflection/Transmission)

IL dynamic range, in transmission mode	70 dB
IL dynamic range, in reflection mode	15 dB Two way loss before backscatter reaches noise floor and IL measurements are no longer possible
Resolution	± 0.1 dB With 10 cm integration width for 20 m mode, and 40 cm for 500 m mode
Accuracy	± 0.2 dB With 10 cm integration width for 20 m mode, and 40 cm for 500 m mode

Physical

Remote interface	SCPI API over TCP/IP
Optical connector type	FC/APC
Dimensions	35 (L) x 47 (W) x 10 (H) cm
Weight (controller not included)	15 lb (7 kg)

Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.

Applications

Spatial RL testing
Automated IL test and analysis
Skew measurement with sub-picosecond resolution
PIC waveguide devices, PLCs, AWGs, ROADMs
Optical fiber networks, cable and subassemblies
Silicon photonics

Included

Instrument mainframe for C band with measurement length modes of up to 100 m in reflection mode (200 m in transmission)
Instrument controller (rack-mountable)
Application software
Accessory kit