MAP Series mVOA-C2B MVOA-C2B12-SB1-M100-MLU 12-Device Variable Optical Attenuator with In/Out Monitors, LC/APC
MEMS-based MAP Series VOA module with 12 attenuators, in/out power monitors and LC/APC singlemode connectors.
- Configuration
- Input and Output Monitor
- Number of Channels
- 12 devices
- Connector
- SMF LC/APC
Overview
The VIAVI MVOA-C2B12-SB1-M100-MLU is a member of the MAP Series High Density Variable Optical Attenuator (mVOA-C2B) family. This configuration provides 12 independently controlled attenuator devices in a single-slot module, with input and output power monitors and singlemode LC/APC connectors.
The mVOA-C2B is based on a MEMS mirror design and offers low insertion loss, return loss and polarization dependent loss, with repeatability, accuracy and long-term stability suited to lab and manufacturing use. It builds on the earlier mVOA-C1 and covers a wavelength range that serves client optic testing, coherent interface development, long-haul network stress testing and silicon photonics development.
Operating modes
The in/out monitor variant supports three operating modes. In Attenuator Mode the user sets the desired attenuation directly through the UI or remote SCPI commands. In Constant Power Mode the monitors actively control the attenuator to maintain a set output power as the input power changes. In IL Mode a VIAVI calibration allows the insertion loss across the input to output ports to be set directly, so the 0 dB loss reference is known.
MAP platform
The module is a hot-pluggable cassette for the VIAVI MAP ecosystem and is designed for use with all MAP-300 generation mainframes. Up to eight modules fit in a single 3U MAP-300 mainframe, allowing up to 96 independently controlled attenuators, which suits network emulation test systems.
Key Features
- 12 independently controlled MEMS-based attenuators in one single-slot module
- Input and output power monitors with Constant Power and IL modes
- Singlemode LC/APC connectors
- Up to 96 attenuators in a single 3U MAP-300 mainframe
- Low insertion loss to minimize loss budget utilization
- High accuracy and repeatability to reduce measurement uncertainty
- Fast transition speed and settling time to reduce testing time
- Flat spectral response for CWDM and DWDM applications
- Low backreflection to reduce instabilities due to reflected light
- Built-in wavelength-calibrated power meter eliminates external connections
- High input power capability for EDFA testing and multi-wavelength applications
- Control via UI or remote SCPI commands
- Hot-swappable cassette for the VIAVI MAP platform
Specifications
| Configuration | Input and Output Monitor |
|---|---|
| Number of Channels |
12 devices
Series available with 4, 8, 12
|
| Connector |
SMF LC/APC
Series available with LC/PC and LC/APC
|
| Wavelength Range | 1260 to 1640 nm |
|---|---|
| Insertion Loss |
<=2.2 dB
Input and Output Monitor configuration
|
| Attenuation Range | > 40 dB |
| Return Loss | 40 dB min/55 dB typ |
| Shutter Isolation | > 45 dB |
| Maximum Optical Input Power |
23 dBm
Input and Output Monitor configuration
|
| Power Setting Range | -40 dBm to 23 dBm |
|---|---|
| Power Setting Resolution | 0.001 dB |
| Repeatability | ±0.10 dB |
| Power Linearity | ±0.02 dB |
| PDL | <0.1 dB |
| Input Power Range for Full Attenuation | -40 dBm to 23 dBm |
|---|---|
| Attenuation Setting Range | 0 dB to 40 dB |
| Repeatability | ±0.10 dB |
| Relative Attenuation Accuracy | ±0.10 dB |
| PDL | <0.1 dB |
| Settling Time |
<500 microsec
Input and Output Monitor configuration
|
|---|---|
| Attenuation Speed | 0.1 dB/s to 1000 dB/s |
| MAP Command Latency | < 1 ms |
| Activation Latency | < 500 μs |
| Trigger Latency | < 10 μs |
| Warm-up Time |
30 min
All optical measurements were taken after minimum 30-minute warm up; measured at constant temperature of 23 ±5°C
|
|---|---|
| Slot Width | 1 standard module |
| Calibration Period | 1 Year |
| Operating Temperature |
10 °C to 40 °C
Requirement
|
| Storage Temperature | -30°C to 60°C |
Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.
Applications
- Network emulation test systems
- Client optic testing
- Next generation coherent interfaces
- Long haul network stress testing
- Silicon photonics development
- EDFA testing
- CWDM and DWDM testing
- Lab and production test environments
