VIAVI MAP Series mVOA-C2B high-density variable optical attenuator module
VIAVI / mVOA-C2B / MAP Modules
MVOA-C2B08-SB1-M100-MLU

VIAVI MAP Series mVOA-C2B MVOA-C2B08-SB1-M100-MLU 8-Channel Variable Optical Attenuator with In/Out Monitors, LC/APC

MEMS-based 8-device MAP-300 attenuator module with input/output power monitors and singlemode LC/APC connectors, covering 1260 to 1640 nm.

Configuration
Input and Output Monitor
Number of Channels
8
Connector
LC/APC
Datasheet

Overview

The MVOA-C2B08-SB1-M100-MLU is a configuration of the VIAVI MAP Series mVOA-C2B high-density variable optical attenuator. It holds eight independently controlled attenuator devices with input and output power monitors and singlemode LC/APC connectors in a single-slot, hot-pluggable cassette for MAP-300 generation mainframes.

The mVOA-C2B uses a MEMS mirror design. VIAVI specifies low insertion loss, return loss and polarization dependent loss, along with repeatability, accuracy and long-term stability. Up to eight modules fit in one 3U MAP-300 mainframe, giving up to 96 attenuators in a single chassis for uses such as network emulation test systems, client optic testing, coherent interface development, long-haul network stress testing and silicon photonics development.

Operating modes

The in/out monitor variant supports three control modes. In Attenuator Mode, the user sets the attenuation directly from the user interface or with remote SCPI commands. In Constant Power Mode, the monitors control the attenuator so that the output power stays at a set value when the input power changes. In IL Mode, a VIAVI calibration lets the user set the insertion loss from the input port to the output port, so the absolute loss is known rather than referenced to an unknown 0 dB point.

Key Features

  • Eight independently controlled MEMS-based attenuators per module
  • Integrated input and output tap-coupler power monitors
  • LC/APC singlemode fiber connectors
  • Attenuator, Constant Power and IL control modes
  • Control from the user interface or remote SCPI commands
  • Single-slot, hot-pluggable module for MAP-300 generation mainframes
  • Up to 96 attenuators in a single 3U MAP-300 mainframe
  • Wavelength range 1260 to 1640 nm
  • Low insertion loss, return loss and PDL
  • Flat spectral response for CWDM and DWDM applications
  • High input power capability for EDFA and multi-wavelength testing

Specifications

General
Configuration Input and Output Monitor
Number of Channels 8
Series available with 4, 8, 12
Connector LC/APC
Series available with LC/PC and LC/APC
Optical
Wavelength Range 1260 to 1640 nm
Insertion Loss <=2.2 dB
Attenuation Range > 40 dB
Return Loss 40 dB min/55 dB typ
Shutter Isolation > 45 dB
Maximum Optical Input Power 23 dBm
Optical – Power Mode (Output Monitor Control)
Power Setting Range -40 dBm to 23 dBm
Power Setting Resolution 0.001 dB
Repeatability ±0.10 dB
Power Linearity ±0.02 dB
PDL <0.1 dB
Optical – IL Mode (Input/Output Closed Loop Control)
Input Power Range for Full Attenuation -40 dBm to 23 dBm
Attenuation Setting Range 0 dB to 40 dB
Repeatability ±0.10 dB
Relative Attenuation Accuracy ±0.10 dB
PDL <0.1 dB
Speed and Timing
Settling Time <500 microsec
Attenuation Speed 0.1 dB/s to 1000 dB/s
MAP Command Latency < 1 ms
Activation Latency < 500 μs
Trigger Latency < 10 μs
Physical
Warm-up Time 30 min
All optical measurements were taken after minimum 30-minute warm up; measured at constant temperature of 23 ±5°C.
Slot Width 1 standard module
Calibration Period 1 Year
Operating Temperature 10 °C to 40 °C
Requirement
Storage Temperature -30°C to 60°C
Ordering Information
MVOA-C2B08-SB1-M100-MLU MAP Series VOA B-type 8 devices In/out power monitors SMF LC/APC

Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.

Applications

  • Network emulation test systems
  • Client optic testing
  • Next-generation coherent interface testing
  • Long-haul network stress testing
  • Silicon photonics development
  • EDFA testing
  • CWDM and DWDM testing
  • Lab and production test

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