VIAVI mVOA-C2B MAP Series high-density variable optical attenuator module
VIAVI / mVOA-C2B / MAP Modules
MVOA-C2B04-SB1-M100-MLC

VIAVI MAP Series mVOA-C2B MVOA-C2B04-SB1-M100-MLC 4-Channel Variable Optical Attenuator with In/Out Monitors, LC/PC

MAP Series MEMS-based variable optical attenuator module with 4 devices, input/output power monitors and SMF LC/PC connectors.

Configuration
Input and Output Monitor
Number of Channels
4 devices
Connector
SMF LC/PC
Datasheet

Overview

The MVOA-C2B04-SB1-M100-MLC is a configuration of the VIAVI MAP Series High Density Variable Optical Attenuator (mVOA-C2B). It has four attenuator devices with input and output power monitors and singlemode fiber LC/PC connectors. The mVOA-C2B is a precision attenuator based on a MEMS mirror design. It replaces the earlier mVOA-C1 and is intended for client optic testing, next-generation coherent interfaces, long-haul network stress testing and silicon photonics development.

The module takes up one slot and is hot-pluggable. It works with all MAP-300 generation mainframes. A single 3U MAP-300 mainframe holds up to eight mVOA-C2B modules, which gives up to 96 independently controlled attenuators across the module family.

Operating modes

Because this variant has input and output monitors, it supports all three mVOA-C2B operating modes. In Attenuator Mode, the user sets the output attenuation directly from the UI or with remote SCPI commands. In Constant Power Mode, the monitors control the attenuator to hold a set output power while the input power changes. In IL Mode, a VIAVI calibration lets the user set the insertion loss between the input and output ports, so the 0 dB loss reference is known.

Key Features

  • Precision MEMS mirror-based attenuation
  • Four independently controlled attenuator devices with input and output power monitors
  • Singlemode fiber LC/PC connectors
  • Attenuator, Constant Power and IL operating modes
  • Control via UI or remote SCPI commands
  • Single-slot, hot-pluggable cassette for MAP-300 generation mainframes
  • Up to 96 attenuators in a single 3U MAP-300 chassis using the module family
  • Low insertion loss, return loss and PDL
  • Fast transition speed and settling time
  • Flat spectral response for CWDM and DWDM applications
  • Built-in wavelength-calibrated power monitoring
  • High input power capability for EDFA and multi-wavelength testing

Specifications

Configuration
Configuration Input and Output Monitor
Number of Channels 4 devices
Series available with 4, 8, 12
Connector SMF LC/PC
Series available with LC/PC and LC/APC
Optical
Wavelength Range 1260 to 1640 nm
All optical measurements taken after minimum 30-minute warm up; measured at constant temperature of 23 ±5°C
Insertion Loss <=2.2 dB
Input and Output Monitor configuration
Attenuation Range > 40 dB
Return Loss 40 dB min/55 dB typ
Shutter Isolation > 45 dB
Maximum Optical Input Power 23 dBm
Input and Output Monitor configuration
Optical – Power Mode (Output Monitor Control)
Power Setting Range -40 dBm to 23 dBm
Power Setting Resolution 0.001 dB
Repeatability ±0.10 dB
Power Linearity ±0.02 dB
PDL <0.1 dB
Optical – IL Mode (Input/Output Closed Loop Control)
Input Power Range for Full Attenuation -40 dBm to 23 dBm
Attenuation Setting Range 0 dB to 40 dB
Repeatability ±0.10 dB
Relative Attenuation Accuracy ±0.10 dB
PDL <0.1 dB
Speed and Timing
Settling Time <500 microsec
Input and Output Monitor configuration
Attenuation Speed 0.1 dB/s to 1000 dB/s
MAP Command Latency < 1 ms
Activation Latency < 500 μs
Trigger Latency < 10 μs
Physical
Warm-up Time 30 min
Slot Width 1 standard module
Calibration Period 1 Year
Operating Temperature 10 °C to 40 °C
Requirement
Storage Temperature -30°C to 60°C

Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.

Applications

  • Client optic testing
  • Next-generation coherent interface testing
  • Long-haul network stress testing
  • Silicon photonics development
  • Network emulation test systems
  • EDFA testing
  • CWDM and DWDM applications
  • Lab and production test

Documents & Resources