VIAVI MAP Series mVOA-C2B high-density variable optical attenuator module
VIAVI / mVOA-C2B / MAP-300 Modules
MVOA-C2B04-SB0-M100-MLU

VIAVI MAP Series mVOA-C2B MVOA-C2B04-SB0-M100-MLU 4-Channel MEMS Variable Optical Attenuator Module, LC/APC

MAP Series mVOA-C2B MEMS attenuator module with 4 independently controlled attenuators, no power monitors, singlemode LC/APC connectors.

Configuration
No Monitor
Number of Channels
4
Connector
LC/APC
Datasheet

Overview

The MVOA-C2B04-SB0-M100-MLU is the 4-device, no-monitor, singlemode LC/APC configuration of the VIAVI MAP Series High Density Variable Optical Attenuator (mVOA-C2B). It is a precision MEMS-based programmable attenuator module offering low insertion loss, return loss and polarization dependent loss, together with high repeatability, accuracy and long-term stability.

The mVOA-C2B builds on the earlier mVOA-C1 and is intended for client optic testing, next-generation coherent interfaces, long-haul network stress testing and silicon photonics development. It covers a wavelength range of 1260 to 1640 nm.

Platform

The module is a single-slot, hot-pluggable cassette for the VIAVI MAP-300 mainframe family. Up to eight modules fit in one MAP-300 mainframe, allowing up to 96 independently controlled attenuators in a 3U chassis when 12-device modules are used. The mVOA-C2B family is offered with 4, 8 or 12 attenuator devices per module, with LC/PC or LC/APC connectors.

Operating mode

As a no-monitor variant, this model operates in Attenuator Mode: the user enters the desired attenuation through the user interface or by remote SCPI command and the module sets it directly (open-loop control). The Constant Power and IL modes are reserved for the in/out monitor variants of the series.

Key Features

  • 4 independently controlled MEMS variable optical attenuators in one module
  • Singlemode LC/APC connectors
  • Insertion loss of 1.6 dB or less
  • Wavelength range 1260 to 1640 nm
  • Maximum optical input power of 27 dBm for EDFA testing and multi-wavelength applications
  • Attenuation range greater than 40 dB
  • Flat spectral response for CWDM and DWDM applications
  • Low backreflection to reduce instabilities due to reflected light
  • Fast attenuation speed of up to 1000 dB/s
  • Attenuation setting through UI or remote SCPI commands
  • Single-slot, hot-pluggable module for MAP-300 generation mainframes
  • Up to 96 attenuators in a single 3U MAP-300 chassis across the mVOA-C2B family

Specifications

Configuration
Configuration No Monitor
Number of Channels 4
Series available with 4, 8, 12 channels
Connector LC/APC
SMF; series available with LC/PC and LC/APC
Optical
Wavelength Range 1260 to 1640 nm
Insertion Loss <=1.6 dB
No Monitor configuration
Attenuation Range > 40 dB
Return Loss 40 dB min/55 dB typ
Shutter Isolation > 45 dB
Maximum Optical Input Power 27 dBm
No Monitor configuration
Optical – Attenuation Mode (Open Loop or No Power Monitor)
Repeatability ±0.05 dB
typ., 0 dB to 30 dB
Repeatability ±0.10 dB
typ., 30 dB to 40 dB
Relative Attenuation Accuracy ±0.15 dB
typ., 0 dB to 10 dB
Relative Attenuation Accuracy ±0.15 dB
typ., 10 dB to 20 dB (as printed)
Relative Attenuation Accuracy ±0.20 dB
typ., 10 dB to 20 dB (as printed; datasheet lists this range twice with different values)
PDL < 0.15 dB
at 0 dB
PDL < 0.30 dB
0 dB to 10 dB
PDL < 0.50 dB
10 dB to 20 dB
Speed and Timing
Attenuation Speed 0.1 dB/s to 1000 dB/s
MAP Command Latency < 1 ms
Activation Latency < 500 μs
Trigger Latency < 10 μs
Physical
Warm-up Time 30 min
All optical measurements were taken after minimum 30-minute warm up; measured at constant temperature of 23 ±5°C
Slot Width 1 standard module
Calibration Period 1 Year
Operating Temperature 10 °C to 40 °C
Requirement
Storage Temperature -30°C to 60°C
Ordering Information
MVOA-C2B04-SB0-M100-MLU MAP Series VOA B-type 4 devices no option SMF LC/APC
Power type: Standard (No Monitors)

Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.

Applications

  • Client optic testing
  • Next-generation coherent interface testing
  • Long-haul network stress testing
  • Silicon photonics development
  • Network emulation test systems
  • EDFA testing
  • CWDM and DWDM testing
  • Lab and production test

Documents & Resources