VIAVI MAP Swept Wavelength System mSWS-A2 for DWDM Component and ROADM Test

MAP-300 based swept wavelength test system measuring IL, PDL, RL and directivity of DWDM devices, ROADMs and circuit packs versus wavelength.

Range: 1520.086 to 1630 nm
Accuracy: ±2 pm absolute
Resolution: User selectable at 3, 1.5, 0.75, or 0.4 pm

Datasheet

Overview

The VIAVI MAP Swept Wavelength System (mSWS-A2) is a test system for measuring insertion loss (IL), polarization dependent loss (PDL), return loss (RL) and directivity of DWDM devices as a function of wavelength. It is used in both research and development and production environments for components and modules such as colorless, directionless, contentionless (CDC) ROADMs, high-port-count wavelength switches, tunable filters and circuit packs.

The system consists of a tunable laser source, a source optics module (SOM), a control module, a receiver chassis, one or more detector modules and application software. It combines the SWS2000 tunable laser and SOM with a measurement receiver based on the VIAVI MAP-300 photonics test platform. The distributed architecture supports up to eight separately controlled measurement stations from one source laser, and installed SWS2000 systems can be upgraded by adding mSWS-A2 based measurement stations.

Measurement

A 4-state polarization controller in the SOM measures four polarization states (0°, 90°, –45° and circular) and uses Mueller matrix analysis to determine PDL and average loss at all scanned wavelengths. Return loss is measured with the optional ORL utility cassette. The wavelength resolution is user selectable between 0.4 and 3 pm.

Software

The application software calculates loss at peak, center wavelength, loss at center wavelength, bandwidth at a given threshold, crosstalk and flatness relative to the measured peak, the ITU grid or a user-defined grid. A set of DLLs gives access to all SWS functionality for custom applications in Visual Basic, C, C++ or LabView. Integration into the MAP-300 platform allows automation with additional switches, laser sources and connector inspection tools.

Key Features

Scalable architecture supporting up to 8 measurement stations from one TLS/SOM transmitter station
±0.002 nm absolute wavelength accuracy over 1520 to 1630 nm
Up to 256 detector channels per station
User-selectable wavelength resolution from 0.4 to 3 pm
Sweep rates up to 100 nm/s with full performance specifications
Dynamic range of >70 dB
4-state polarization controller with Mueller matrix PDL analysis
Analysis relative to measured peak, ITU grid or user-defined grid
DLLs for custom applications in Visual Basic, C, C++ or LabView
Upgrade path for installed SWS2000 systems

Specifications

Wavelength

Range	1520.086 to 1630 nm
Accuracy	±2 pm absolute Web page states ± 0.002 nm absolute wavelength accuracy
Resolution	User selectable at 3, 1.5, 0.75, or 0.4 pm

Measurement Time

SOM sweep rates	10, 20, 40, and 100 nm/s All channels are measured in parallel. Web page states high speed scanning up to 40 nm/s; datasheet lists up to 100 nm/s
C band sweep period at 10 nm/s	8 s In continuous scanning mode with delay set to zero and direct Ethernet connection; high-channel-count systems will require several seconds of delay
C band sweep period at 20 nm/s	5.5 s In continuous scanning mode with delay set to zero and direct Ethernet connection
C band sweep period at 40 nm/s	4 s In continuous scanning mode with delay set to zero and direct Ethernet connection
C band sweep period at 100 nm/s	3 s In continuous scanning mode with delay set to zero and direct Ethernet connection
C+L band sweep period at 10 nm/s	15 s In continuous scanning mode with delay set to zero and direct Ethernet connection
C+L band sweep period at 20 nm/s	9 s In continuous scanning mode with delay set to zero and direct Ethernet connection
C+L band sweep period at 40 nm/s	6 s In continuous scanning mode with delay set to zero and direct Ethernet connection
C+L band sweep period at 100 nm/s	4 s In continuous scanning mode with delay set to zero and direct Ethernet connection

Insertion Loss

Measurement range, stand-alone station	70 dB For > 10 dBm to DUT
Measurement range, distributed station	60 dB For > 10 dBm to DUT
Noise at 10 nm/s, 0 to –20 dB	< ±0.005 dB Noise value is 3 X standard deviation
Noise at 10 nm/s, –20 to –40 dB	< ±0.02 dB Noise value is 3 X standard deviation
Noise at 10 nm/s, –40 to –50 dB	< ±0.05 dB Noise value is 3 X standard deviation
Noise at 10 nm/s, –50 to –60 dB	< ±0.2 dB Noise value is 3 X standard deviation
Base uncertainty	±0.03 dB Total IL uncertainty before noise or slope error, assuming SOM to mSWS-A2RX receiver fiber static, FC/PC connector to mSWS-A2DM detector, and temperature within ±1°C
Resolution	0.001 dB
Maximum slope tracking	>0.4 dB/pm At 10 nm/s, 0 to –60 dB IL

Return Loss

Measurement range	60 dB Requires ORL utility cassette, which is used in conjunction with mSWS-A2DM and mSWS-A2RX cassettes
Noise at 10 nm/s, 0 to –20 dB	< ±0.02 dB Noise value is 3 X standard deviation
Noise at 10 nm/s, –20 to –40 dB	< ±0.06 dB Noise value is 3 X standard deviation
Noise at 10 nm/s, –40 to –50 dB	< ±0.2 dB Noise value is 3 X standard deviation
Noise at 10 nm/s, –50 to –60 dB	< ±0.5 dB Noise value is 3 X standard deviation

PDL

Measurement range	50 dB At –10 dBm to DUT and a sweep rate of 10 nm/s; measurement range reduced at higher speeds
Noise at 10 nm/s, 0 to –20 dB	< ±0.01 dB Noise value is 3 X standard deviation
Noise at 10 nm/s, –20 to –40 dB	< ±0.04 dB Noise value is 3 X standard deviation
Noise at 10 nm/s, –40 to –50 dB	< ±0.1 dB Noise value is 3 X standard deviation
Resolution	0.001 dB

System

Dynamic range	>70 dB
Measurement stations per source laser	up to eight
Detector channels per station	Up to 256
Polarization states	0°, 90°, –45°, and circular polarization 4-state polarization controller located within the SOM; Mueller matrix analysis

Safety

Compliance	CE requirements as well as UL3101.1 and CAN/CSA - C22.2 No. 1010.1
Source Optics Module laser class SWS20010	Class 1 Classified per IEC standard 60825-1(2002); complies with 21CFR1040.10, except for deviations per Laser Notice No. 50, July 2001
Tunable Laser Source laser class SWS17101	Class 3B Classified per IEC standard 60825-1(2002); web page also lists SWS18101

Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.

Applications

Optical component and module characterization in manufacturing, development and research
ROADMs
Wavelength-selective switches
Wavelength blockers
Optical circuit packs
DWDM and CWDM devices
Tunable filters
Couplers and splitters
Optical switches and attenuators
Fiber Bragg gratings (FBGs)
Interleavers
Dichroic filters
MEMS and waveguide devices

Options & Accessories

Option	Description
mSWS-A2SLS	C+L band tunable laser — mSWS core system
mSWS-A2S0M	Dual-output integrated source optic module (SOM) — mSWS core system
mSWS-A2TX	Four-output telemetry transmitter expansion module (SOM) — mSWS core system
MAP-380	MAP-300 8-slot mainframe — mSWS core system; refer to MAP-300 data sheet for available mainframe options
mSWS-A2DM	mSWS quad detector module — mSWS core system
mSWS-A2RX	mSWS telemetry receiver — mSWS core system
mUTL-A1000	ORL utility cassette — With option MUTL-A150LR
mSWS-PMJ	PM fiber jumper for mSWS — mSWS core system
AC900	Detector cap
AC901	FC detector adapter
AC102	ST detector adapter
AC903	SC detector adapter
AC918	LC detector adapter
AC920	Bare fiber adapter holder
AC921	Bare fiber adapter — Includes one AC920