Nicslab Mini ATE mixed-signal automatic test equipment
Nicslab / Multichannel SMU
Mini ATE

Nicslab Mini ATE Compact Mixed-Signal Automatic Test Equipment

Compact automatic test equipment with 8 digital channels at 100 MHz and 2 analog force/measure channels for mixed-signal IC testing.

Channels
8 Digital Channels, 2 Analog Channels

Overview

The Nicslab Mini ATE is a compact automatic test equipment (ATE) platform intended as a complete solution for mixed-signal integrated circuit testing.

The system integrates digital vector generation with analog force and measurement capability within a single test vector. Digital and analog operations are coordinated under strict timing requirements, which reduces setup time and keeps digital and analog events synchronized for mixed-signal test sequences.

Software

Test patterns are developed and managed through a graphical user interface, where users can import, edit or create patterns, configure pin maps, define levels and set timing. Vectors can be created manually or automatically, and configurations and pattern files are saved and reloaded in XML format. Built-in common protocol support for I²C, SPI and UART automatically assigns pin maps, levels and timing per pin.

Key Features

  • 8 digital channels with 100 MHz vector-based pattern generation
  • 2 analog channels for integrated force and measurement
  • Digital pin electronics from -1.5 V to 5 V with active load capability
  • Analog force voltage up to ±20 V and force current up to ±1 A
  • GUI for developing and managing test patterns: import, edit or create patterns, configure pin maps, define levels and set timing
  • Manual and automatic vector creation
  • XML-based configuration and pattern file saving and reloading
  • Built-in common protocol support for I²C, SPI and UART with automatic per-pin assignment of pin maps, levels and timing

Specifications

General
Channels 8 Digital Channels, 2 Analog Channels
Digital
Digital Pin Electronics -1.5 V to 5 V
Maximum Vector Rate 100 MHz
10 ns minimum vector period
Pattern Timing 8 time sets, 10 ns edge placement resolution
Drive Formats Non-Return (NR), Return-to-Low (RL), Return-to-High (RH)
Vector Memory Depth 65 K
Opcode Support Repeat, for_loop, jump, jump_if
Analog
Analog Force Update Rate Up to 1 MUPS
Analog Measurement Sampling Rate Up to 1 MUPS
Voltage Range ±20 V
Current Range ±1 A
Analog Settling Time < 5 µs
Analog Edge Placement Resolution 10 ns

Applications

  • Mixed-signal IC testing
  • Digital pattern generation
  • Analog force and measurement
  • I²C, SPI and UART device testing