Luna OVA 5100 Optical Vector Analyzer instrument
Luna / Optical Component Test / Component Characterization
OVA 5100

Luna OVA 5100 Optical Vector Analyzer

Optical vector analyzer that measures loss, dispersion, polarization and phase response of optical components in a single laser sweep.

Wavelength range
1525 - 1610 nm
Wavelength range
1270 - 1340 nm
Standard resolution
1.6 pm
Accuracy
±1.5 pm
Datasheet

Overview

The Luna OVA 5100 is an optical vector analyzer for loss, dispersion and polarization analysis of optical devices and systems, including photonic integrated circuits (PICs). It directly replaces the OVA 5000 with equivalent functionality, in a smaller and lighter form factor.

The instrument characterizes all parameters of a fiber component through a single connection and a single sweep of a tunable laser. Typical devices range from couplers to specialty fiber, including fiber Bragg gratings, arrayed waveguide gratings, free-space filters, tunable devices and amplifiers.

Measurement principle

The OVA 5100 uses an interferometric method to directly measure the linear transfer function (Jones matrix), capturing its four complex elements at every wavelength. Standard linear parameters, including IL, RL, GD, CD, PMD and PDL, are extracted from this data.

Options

With the Optical Frequency Domain Reflectometer (OFDR) option, the OVA 5100 also operates as a high-resolution reflectometer for locating reflective events inside miniature photonic devices and waveguides. The optional Polarization Analysis Software calculates the response of a component to simulated input polarization states, so no physical polarization alignment is needed. It displays insertion loss, group delay and impulse response for a user-defined input state, together with values for the principal states of polarization.

The OVA 5100 covers the C and L bands. The OVA 5113 model covers the O band.

Key Features

  • Single measurement, all-parameter analysis of components
  • Full characterization of passive devices in under 3 seconds
  • Complete polarization response
  • Single scan simultaneously measures insertion loss, PDL, PMD and second-order PMD, chromatic dispersion, group delay, optical time domain response, Jones matrix elements and optical phase response
  • High resolution C and L band (OVA 5100) or O band (OVA 5113) capability
  • Real-time measurements
  • User-friendly interface
  • Optional OFDR reflectometry with 20 μm sampling resolution and "Zero Dead Zone"
  • Optional Polarization Analysis Software for simulated input polarization states

Specifications

Wavelength
Wavelength range
OVA 5100
1525 - 1610 nm
Product web page lists this range for "OVA 5000"; data sheet assigns it to OVA 5100
Wavelength range
OVA 5113
1270 - 1340 nm
Product web page lists this range for "OVA 5013"; data sheet assigns it to OVA 5113
Standard resolution 1.6 pm
Accuracy ±1.5 pm
Accuracy maintained by an internal NIST-traceable HCN gas cell
Repeatability ±0.1 pm
Optical Phase Error
30 m mode ±0.05 radians (Fast Mode); ±0.0075 radians (Averaging Mode)
Fast Mode: no averaged calibration scans, 4 averaged measurement scans, 30 pm RBW, 8 m device length. Averaging Mode: 4 calibration and 64 measurement scans averaged
Loss Characteristics
Dynamic range 60 dB (Fast Mode); 80 dB (Averaging Mode)
80 dB in Averaging Mode requires the High Dynamic Range option installed and enabled
Ripple ±0.05 dB (Fast Mode); ±0.01 dB (Averaging Mode)
Resolution ±0.05 dB (Fast Mode); ±0.002 dB (Averaging Mode)
Insertion loss accuracy ±0.1 dB (Fast Mode); ±0.05 dB (Averaging Mode)
Return loss accuracy ±0.2 dB (Fast Mode); ±0.1 dB (Averaging Mode)
Chromatic Dispersion
Accuracy ±10 ps/nm (Fast Mode); ±5 ps/nm (Averaging Mode)
Group Delay
Range 6 ns
Total device impulse-response duration that may be captured
Accuracy ±0.2 ps (Fast Mode); ±0.1 ps (Averaging Mode)
Loss range 45 dB (Fast Mode); 60 dB (Averaging Mode)
60 dB in Averaging Mode requires the High Dynamic Range option
PMD
Range 6 ns
Total device impulse-response duration that may be captured
Accuracy - first order ±0.03 ps (100 pm steps), ±0.15 ps (30 pm steps) (Fast Mode); ±0.08 ps (Averaging Mode)
Accuracy - second order ±10 ps² (Fast Mode); ±2 ps² (Averaging Mode)
Loss range 40 dB (Fast Mode); 50 dB (Averaging Mode)
50 dB in Averaging Mode requires the High Dynamic Range option
PDL
Extinction ratio (dynamic range) 40 dB (Fast Mode); 50 dB (Averaging Mode)
Accuracy ±0.05 dB (Fast Mode); ±0.03 dB (Averaging Mode)
Measurement Timing
Laser sweep rate 70 nm/s
All-parameter measurement rate 30 ms/nm
Rate calculated from combined laser sweep and analysis time per scan
Fully specified measurement time 12 s (Fast Mode); 55 s (Averaging Mode)
Fast Mode over 40 nm range, Averaging Mode over 2.5 nm range; excludes calibration time
Real-time mode update rate (2.5 nm scan) 1 Hz
Fast Mode only
Maximum Device Length (including leads)
Transmission 150 m
Reflection 75 m
OFDR Option
Sampling resolution
OPT02004
20 μm
With OFDR option
Sensitivity
OPT02004
>95 dB
With OFDR option
Physical
Class 1 Laser <10 mW
Operating power 100 W
Weight (controller not included) 25 lb (11.4 kg)
Case Size (W x D x H) 14.4 x 13.6 x 6.5 in (366 x 345 x 165 mm)

Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.

Applications

  • Planar light circuit and silicon photonic device analysis
  • PIC and silicon photonics testing
  • Optical fiber component characterization
  • Spectral response and time delay response measurement
  • Device simulation and modeling with complete transfer function
  • Testing fiber optic networks and assemblies
  • Research, product development and manufacturing test

Included

  • OVA 5100 mainframe
  • OVA software
  • Instrument controller (workstation-class laptop or desktop PC)
  • Accessory kit

Options & Accessories

Option Description
OVA 5100 Optical Vector Analyzer, 1525 nm - 1610 nm — OVA 5100 mainframe for C and L band, OVA software, instrument controller (workstation-class laptop or desktop PC) and accessory kit.
OVA 5113 Optical Vector Analyzer, 1270 nm - 1340 nm — OVA 5100 mainframe for O band, OVA software, instrument controller (workstation-class laptop or desktop PC) and accessory kit.
OPT02003 Desktop Analysis Software — Software providing all of the analysis and data visualization of the OVA 5100, using only saved OVA measurement data files.
OPT02004 OFDR Option — Optical Frequency Domain Reflectometer (OFDR) software for performing high-resolution reflectometry measurements.
OPT02005 Polarization Analysis Software — Analyzes response to simulated input polarization states.
OPT02006 Expanded Dynamic Range — Enables enhanced dynamic range (see Performance table).
OPT02007 Custom Software Development Kit — SDK toolkit with DLLs allowing custom GUI development.

Documents & Resources