Luna OCDR-1000 Optical Coherence Domain Reflectometer
Optical coherence domain reflectometer that measures space-resolved reflections inside fiber optic components and PICs over a 600 mm span.
- Wavelength
- 1310 or 1550 nm
- Spatial resolution
- <20µm
- Spatial accuracy
- <0.1 (±0.01%) mm
- Measurement range
- 600mm
Overview
The Luna OCDR-1000 is an optical coherence domain reflectometer designed to obtain space-resolved reflection information inside a fiber optic component, such as a Photonic Integrated Circuit (PIC), in order to diagnose quality or design issues.
The instrument is based on a polarization-optimized white light interferometer and was positioned as a lower-cost alternative to OFDR technology. Its high dynamic range prevents small reflection peaks from being masked by the large reflections typical of the input surface of an optical device.
A set of length-matching delay modules is available to match the pigtail lengths of the devices under test and place the 600 mm measurement span in the region of interest. With a reflection dynamic range of over 70 dB and fine spatial resolution, the OCDR-1000 lets engineers and researchers locate defects inside an optical device.
The OCDR-1000 has been discontinued by the manufacturer. Luna lists the Lightwave Component Analyzer (Luna 6400 Series) as its replacement.
Key Features
- Distributed reflectivity measurement
- Event detection
- Large RL range
- High spatial resolution
- Clear identification of large and small reflection peaks for easier data interpretation
- Polarization-optimized white light interferometer
- Length-matching delay modules to position the 600 mm measurement span
Specifications
| Wavelength | 1310 or 1550 nm |
|---|---|
| Spatial resolution |
<20µm
in SMF-28 fiber
|
| Spatial accuracy |
<0.1 (±0.01%) mm
in air
|
| Measurement range | 600mm |
| RL dynamic range | 70 dB |
|---|---|
| RL total measurement range | 10 to 88 dB |
| RL sensitivity | −90 dB (−95 dB typical) |
| RL accuracy | ±1.0 dB |
Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.
Applications
- PIC and silicon photonics testing
- Reflectivity and path length measurement of small devices and assemblies under 600 mm
- Defect location inside optical components
Documents & Resources
Related Products
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Discontinued white-light interferometer that measures the magnitude and location of polarization crosstalk in PM fiber and birefringent waveguides.