Luna 6415 Lightwave Component Analyzer
OFDR-based lightwave component analyzer measuring insertion loss, return loss and length with 20 μm sampling resolution.
- Measurement length modes, reflection mode
- 20 m, 50 m; Optional: 100 m, 200 m
- Measurement length modes, transmission mode
- 40 m, 100 m; Optional: 200 m, 400 m
- Sampling resolution (two-point)
- 20 µm
- Wavelength accuracy
- ± 8 pm
Overview
The Luna 6415 is a lightwave component analyzer for testing passive optical components and fiber optic networks. It measures and analyzes the insertion loss (IL) and return loss (RL) distribution, as well as length, scanning the optical component in either reflection or transmission mode.
The instrument uses optical frequency domain reflectometry (OFDR) to measure backscattered or transmitted light as a function of distance. Its high sensitivity and sampling resolution of 20 μm make it suited to photonic integrated circuits (PICs), silicon photonics, passive components and fiber optic assemblies.
By measuring RL, IL and length or delay in reflection or transmission with a single instrument, the Luna 6415 reduces the cost and complexity of test while increasing throughput in production environments. In reflection, standard measurement length modes are 20 m and 50 m, with 100 m and 200 m available through the extended range option OPT06450.
The instrument is controlled from a workstation laptop running the application software and can be operated remotely through SCPI commands over TCP/IP.
The Luna 6415 has been discontinued by the manufacturer; the Lightwave Component Analyzer (LWA 7601-C) is the listed replacement.
Key Features
- Accurate return loss (RL) and insertion loss (IL) analyzer
- Track and analyze return loss (RL) and insertion loss (IL) versus length
- Analyze components in both reflection and transmission
- Spectral analysis of IL and RL
- Automatic RL/IL event detection
- Trace distributed loss over length of optical path, with sampling resolution down to 20 μm
- Detect and precisely locate reflective events and measure path length
- Skew measurement with sub-picosecond resolution
- Measurement length modes of 20 m and 50 m in reflection, 100 m and 200 m optional
- Remote control via SCPI commands
Specifications
| Measurement length modes, reflection mode |
20 m, 50 m; Optional: 100 m, 200 m
Optional modes with extended range option OPT06450
|
|---|---|
| Measurement length modes, transmission mode |
40 m, 100 m; Optional: 200 m, 400 m
Optional modes with extended range option OPT06450
|
| Sampling resolution (two-point) |
20 µm
Distance between two sample points along the length axis in SMF-28
|
| Wavelength accuracy |
± 8 pm
Accuracy guaranteed via internal NIST-traceable HCN gas cell
|
| Time-of-flight delay accuracy |
± 0.001 %
Accuracy guaranteed via internal NIST-traceable HCN gas cell
|
| Center wavelength |
1546.69 nm
Web page states 1546.7 nm; datasheet value used
|
| Wavelength scan range | ± 20 nm |
| Measurement time (in continuous mode) | 0.08 s (20 m), 0.8 s (200 m) |
| Maximum optical power | 5 mW |
| RL dynamic range |
70 dB
Range between strongest reflection greater than -60 dB and noise floor
|
|---|---|
| Total range |
0 to -130 dB
Noise floor return loss at half of maximum length
|
| Sensitivity |
-135 dB
Noise floor return loss at half of maximum length
|
| Resolution |
± 0.1 dB
Measured with 1 cm integration width
|
| Accuracy |
± 0.2 dB
Measured with 1 cm integration width
|
| IL dynamic range, in transmission mode | 70 dB |
|---|---|
| IL dynamic range, in reflection mode |
15 dB
Two way loss before backscatter reaches noise floor and IL measurements are no longer possible
|
| Resolution |
± 0.1 dB
With 10 cm integration width for 20 m mode
|
| Accuracy |
± 0.2 dB
With 10 cm integration width for 20 m mode
|
| Remote interface | SCPI API over TCP/IP |
|---|---|
| Optical connector type | FC/APC |
Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.
Applications
- Manufacturing test of fiber optic assemblies
- PIC and silicon photonic testing
- Fiber optic link length and latency testing
- Spatial RL testing
- Automated IL test and analysis
- PLCs, waveguide devices, AWGs and ROADMs
- Filters, couplers, switches and beam splitters
Included
- Instrument mainframe with measurement length modes of up to 50 m in reflection (100 m in transmission)
- Instrument controller (workstation laptop)
- Application software
- Accessory kit
Options & Accessories
| Option | Description |
|---|---|
| OPT06450 | Extended range option — Extends measurement length of the Luna 6415 to 200 m in reflection (400 m in transmission) |