Luna LST 4100 Laser Spectrum Tester for On-Wafer Laser Testing
Optical laser parameter tester that measures laser power, wavelength and SMSR at 100 Hz for on-wafer PIC laser testing.
- Sweep speed
- 10 msec
- Operating wavelength
- 1260 – 1360 nm
- SMSR mask
- -35 dB from 0.2 nm to 1.5 nm from main laser mode
- Scan range
- 4.5 < ∆λ < 5.7 nm
Overview
The Luna LST 4100 is an optical laser parameter tester for on-wafer applications where speed and accuracy matter. It measures laser power, wavelength and side-mode suppression ratio (SMSR) repeatably at 100 Hz while laser current and temperature are varied.
Measurement principle
The instrument combines Luna's patented fiber Fabry-Perot filter and wavelength reference technology with on-board DSP and real-time FPGA processing taken from the HYPERION sensing platform. Together these let the LST 4100 capture full laser spectrum data, detect the laser peak and side modes, and report these parameters every 10 msec.
Production use
The LST 4100 is intended for high-speed, high-volume laser qualification testing on the wafer. Luna positions it as a lower-cost alternative to traditional optical spectrum analyzers, since one unit can replace several slower instruments, cutting capital cost, floor space and complexity in PIC fabrication. It covers 1260 to 1360 nm, which suits silicon photonic laser applications such as LiDAR and WDM data center laser transmitters.
Key Features
- 10 msec measurement of laser parameters
- Designed for on-wafer test of laser die PIC
- Scan range: 1260 - 1360 nm
- Measures SMSR to <35db at 0.2 nm from laser mode
- Laser power, wavelength and SMSR measured at 100 Hz while laser current and temperature are varied
- Patented fiber Fabry-Perot filter and wavelength reference technology
- On-board DSP and real-time FPGA processing from the HYPERION sensing platform
- TCP-IP interface supporting up to 8 instruments
Specifications
| Sweep speed | 10 msec |
|---|---|
| Operating wavelength | 1260 – 1360 nm |
| SMSR mask | -35 dB from 0.2 nm to 1.5 nm from main laser mode |
| Scan range | 4.5 < ∆λ < 5.7 nm |
| Maximum laser input power | 10 dBm |
| Wavelength accuracy | 0.1 nm |
| Wavelength resolution | 0.01 nm |
| Wavelength repeatability | ± 0.023 nm |
| Wavelength calibration | internal |
| Power accuracy | ± 1 dB |
| Power resolution | ± 0.1 dB |
| Power repeatability | ± 0.5 dB |
| Optical noise floor | -60 dBm |
| Dynamic range | >65 dB |
| Return loss | >25 dB |
| Interface | TCP-IP, supports up to 8 instruments |
| Optical connector type | LC/APC |
|---|---|
| Compatible fibers | SMF or PMF |
| Operating temperature |
10 to 50-20 to 60 C, < 80%RH non-condensing
Printed this way on both the web page and the datasheet; the range is ambiguous as published
|
| Storage temperature |
-30 to 70 C, < 95%RH non-condensing to 60
Printed this way on both the web page and the datasheet
|
| Dimensions (WxDxH)/weight | 206 x 274 x 79/3.0 mm/kg |
Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.
Applications
- On-wafer test of laser die PICs
- Repeat measurements over various laser currents and temperatures
- Determining good lasers before dicing and packaging
- High-volume laser qualification testing
- LiDAR laser testing
- WDM data center laser transmitters
- Silicon photonic laser applications